Quantifying Focus-spot related Yield LossGarry Tuohy, GLOBALFOUNDRIES Inc., Dresden, Germany.Dec 12, 2021Dec 12, 2021
Calculating Kill Ratios on Multi-Component DevicesThe advent of multi-component devices has served to slow the reduction in die size. Relying on die-level contingency analysis to determine…Jul 30, 2021Jul 30, 2021
The application of a heuristic implementation of Quantile Regression to Defect vs.Quantile Regression is presented as a practical method for completely describing the relationship between Defect Inspection Data and…Jul 29, 2021Jul 29, 2021
The negative binomial distribution — everything you wanted to know and otherwiseGentle IntroductionDec 22, 2020Dec 22, 2020
